{"id":8811,"date":"2021-01-20T13:59:17","date_gmt":"2021-01-20T05:59:17","guid":{"rendered":"https:\/\/www.attopsemi.com\/attopsemi-released-white-paper-i-fuse-most-reliable-and-fully-testable-otp\/"},"modified":"2023-06-19T10:15:44","modified_gmt":"2023-06-19T02:15:44","slug":"attopsemi-released-white-paper-i-fuse-most-reliable-and-fully-testable-otp","status":"publish","type":"post","link":"https:\/\/www.attopsemi.com\/zh-hant\/attopsemi-released-white-paper-i-fuse-most-reliable-and-fully-testable-otp\/","title":{"rendered":"Attopsemi Released White Paper &#8220;I-fuse &#8211; Most Reliable and Fully Testable OTP&#8221;"},"content":{"rendered":"<p><strong>Hsinchu, Taiwan \u2013 January 20, 2021<\/strong><\/p>\n<p>Attopsemi, innovator of I-fuse\u2122 one-time programmable (OTP) IP provider, today announced the availability of a white paper titled \u201cI-fuse\u2122 &#8212; Most Reliable and Fully Testable OTP\u201d. This paper discusses performance characteristics of I-fuse\u2122, a non-breaking fuse technology.<\/p>\n<p>Attopsemi, a fuse-based OTP IP provider, has I-fuse\u2122 IP across all CMOS processes from 0.7um to 22nm, 7nm, and beyond, including G, LP, ULP, mixed signal, high voltage, BCD processes, and FD-SOI, etc. I-fuse\u2122 is a revolutionary \u201cnon-explosive\u201d fuse technology that can be programmed below thermal runaway and above electro-migration (EM) threshold, providing small area, low read voltage\/current, low program voltage\/current, wide temperature, high reliability, and solving for OTP testability completely.<\/p>\n<p>Patented by Attopsemi\u2122, I-fuse\u2122 is a non-breaking fuse technology that can be reliably programmed by heat assisted electromigration below a break point. Any cell can be tested as programmable if the initial fuse resistance is low enough (e.g. &lt;400 ohms) to generate enough heat for programming. The program voltage range can be tested and calibrated in a way that program yield can be predicted accurately. In I-fuse\u2122 design, a non-destructive programmed state can be created by applying a low voltage programming during read, called Concurrent Low-Voltage Write Read (CLVWR). By combining the normal read and fake-programmed read, complicated SRAM-like test patterns can be generated to fully test a complete I-fuse\u2122 OTP macro with 100% fault coverage.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Lorem ipsum dolor sit amet, consectetuer adipiscing elit. Aenean massa.<\/p>\n","protected":false},"author":10,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[104,107],"tags":[],"class_list":["post-8811","post","type-post","status-publish","format-standard","hentry","category-104","category-2021-zh-hant"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Attopsemi Released White Paper &quot;I-fuse - Most Reliable and Fully Testable OTP&quot; - Attopsemi Technology Co., Ltd.<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.attopsemi.com\/attopsemi-released-white-paper-i-fuse-most-reliable-and-fully-testable-otp\/\" \/>\n<meta property=\"og:locale\" content=\"zh_TW\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Attopsemi Released White Paper &quot;I-fuse - Most Reliable and Fully Testable OTP&quot; - Attopsemi Technology Co., Ltd.\" \/>\n<meta property=\"og:description\" content=\"Lorem ipsum dolor sit amet, consectetuer adipiscing elit. 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