{"id":8844,"date":"2019-07-16T14:23:35","date_gmt":"2019-07-16T06:23:35","guid":{"rendered":"https:\/\/www.attopsemi.com\/attopsemi-technology-attended-chipex2019-and-presented-a-speech-i-fuse-a-disruptive-otp-one-time-programmable\/"},"modified":"2023-06-19T10:19:32","modified_gmt":"2023-06-19T02:19:32","slug":"attopsemi-technology-attended-chipex2019-and-presented-a-speech-i-fuse-a-disruptive-otp-one-time-programmable","status":"publish","type":"post","link":"https:\/\/www.attopsemi.com\/zh-hant\/attopsemi-technology-attended-chipex2019-and-presented-a-speech-i-fuse-a-disruptive-otp-one-time-programmable\/","title":{"rendered":"Attopsemi Technology Attended ChipEx2019 and Presented a Speech &#8220;I-fuse A Disruptive OTP (One-Time Programmable)&#8221;"},"content":{"rendered":"<p><strong>Hsinchu, Taiwan \u2013 July 16, 2019<\/strong><\/p>\n<p>Attopsemi Technology attended ChipEx2019 on May 3, 2019 in Tel Aviv, Israel and provided a talk \u201cI-fuseTM A Disruptive OTP (One-Time Programmable).\u201d ChipEx is the largest annual event of the Israeli Semiconductor industry. About 100 vendors, service providers, manufacturers of electronic design tools, components and manufacturing equipment from around the globe joined this event that attracted several hundreds of attendees.<\/p>\n<p>In a well-received speech during the Technical Session, Jeffrey Lin, General Manager of Attopsemi, presented the topic \u201cI-fuse\u2122 OTP for Low-Power application.\u201d In the IoT IC market, low leakage and low power are two crucial features Low leakage means energy can be saved during idle state or standby state. Low power operation means battery can last longer when continuously in active mode. I-fuse\u2122 is a revolutionary \u201cnon-explosive\u201d fuse technology that can be programmed below thermal runaway and above electro-migration (EM) threshold. This is different from other kinds of fuse technologies which are \u201cexplosive\u201d during programming. On the contrary, I-fuse\u2122 programming follows the physics, which is based on heat generation, heat dissipation, and electro-migration. The reliability of Attopsemi\u2019s I-fuse\u2122 is guaranteed by physics.<\/p>\n<p>\u201cBesides IOT, Automotive ICs goal to achieve ZERO defect and high reliability\u201d explained by Jeffrey Lin. \u201cZERO defect means no defect after shipping because of high cost for field return. Any defects should be fully tested and screened away before shipping. Therefore, testability is essential to reach this Holy Grail. Only I-fuse\u2122 among all OTP technologies can reach this goal by our proprietary screening technique.\u201d<\/p>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"\" src=\"https:\/\/static.designandreuse.com\/news_img19\/20190716_1.jpg\" alt=\"\" width=\"480\" height=\"321\" longdesc=\"https:\/\/static.designandreuse.com\/news_img19\/20190716_1.jpg\" \/><\/p>\n<p><em>Jeffrey Lin, General Manager of Attopsemi<\/em><em>\u00a0provided a speech \u201cI-fuse A Disruptive OTP (One-Time Programmable).\u201d<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Hsinchu, Taiwan \u2013 July 16, 2019 Attopsemi Technology at [&hellip;]<\/p>\n","protected":false},"author":19,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[104,109],"tags":[],"class_list":["post-8844","post","type-post","status-publish","format-standard","hentry","category-104","category-2019-zh-hant"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.9 - 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