I-fuse®: Most Reliable and Fully Testable OTP
Most Reliable and Fully Testable OTP
Patented by Attopsemi Technology, I-fuse® is a revolutionary non-breaking fuse technology that can be reliably programmed by heat-assisted electromigration below a breakpoint. Any cell can be tested as programmable if the initial fuse resistance is low enough (e.g. ＜400 ohms) to generate enough heat for programming. The program voltage range can be tested and calibrated in a way that program yield can be predicted accurately. In I-fuse® design, a pseudo-programmed state can be created by applying a low voltage programming during reading, called Concurrent Low-Voltage Write Read (CLVWR). By combining the normal read and pseudo-programmed read, complex SRAM-like test patterns can be generated to fully test a complete I-fuse® OTP macro with 100% fault coverage.