Technology
Revolutionary I-fuse® Mechanism
Power devices should not operate in thermal runaway.
Should program a fuse like I-fuse®
I-fuse®
non-Explosive fuse
Guaranteed reliable by physics
efuse
Explosive fuse
Create debris grow back
I-fuse® Full Testablility
OTP inherently not testable
- Fully tested before shipping; but can’t be used any more
- Blank OTP reads all 0s; can’t detect any stuck-at faults
I-fuse® can be fully testable
- Guarantee PGM for all cells: if initial fuse <400Ω to create heat for PGM
- Guarantee 100% programmable: if PGM conditions within specs
- Fully testable*: every functional block, including program circuits
I-fuse® special circuit design (CLVWR)
- Soft PGM before real PGM
- Check every bit function well or not
- Tested in the wafer level before pre-bump
- Needs no 48hr/250°C pre-bake, UV erase, and re-test
Concurrent Low-Voltage Write/Read
- Create “non-destructive PGM” state to generate fake reading 1, not 0
- Low Voltage PGM during read can make unPGM’d fuses read as 1
- Generate 0/1 in SRAM-like of test patterns to fully test OTP macro
System
PCB
$100
Module
$10
Package
$1
Wafer
$0.1
I-fuse® Full Testablility
OTP inherently not testable
- Fully tested before shipping; but can’t be used any more
- Blank OTP reads all 0s; can’t detect any stuck-at faults
I-fuse® can be fully testable
- Guarantee PGM for all cells: if initial fuse <400Ω to create heat for PGM
- Guarantee 100% programmable: if PGM conditions within specs
- Fully testable*: every functional block, including program circuits
System
$1,000
PCB
$100
Module
$10
Package
$1
Wafer
$0.1
I-fuse® special circuit design (CLVWR)
- Soft PGM before real PGM
- Check every bit function well or not
- Tested in the wafer level before pre-bump
- Needs no 48hr/250°C pre-bake, UV erase, and re-test
Concurrent Low-Voltage Write/Read
- Create “non-destructive PGM” state to generate fake reading 1, not 0
- Low Voltage PGM during read can make unPGM’d fuses read as 1
- Generate 0/1 in SRAM-like of test patterns to fully test OTP macro
Revolutionary I-fuse® vs Conventional OTP
I-fuse®
eFuse
Oxide rupture
Floating-gate
Revolutionary I-fuse®: Non-breaking fuse
- Very Compact size, no charge pump, high reliability
- PGM’d based on physics laws, like any logic devices
- PGM’d at core/IO voltage, testable as any logic devices
Conventional OTP
- Inherent NVM Problems
- Treat and PGM’d as NVM
- Large size, HV PGM, w/ charge pumps
- Hard to use, low reliability
- Break fuse, Rupture oxide,
- Trap charges in floating gates
Comparison between Revolutionary I-fuse® and Conventional OTP
I-fuse®
Revolutionary I-fuse®: Non-breaking fuse
- Very Compact size, no charge pump, high reliability
- PGM’d based on physics laws, like any logic devices
- PGM’d at core/IO voltage, testable as any logic devices
eFuse
Oxide rupture
Floating-gate
Conventional OTP
- Inherent NVM Problems
- Treat and PGM’d as NVM
- Large size, HV PGM, w/ charge pumps
- Hard to use, low reliability
- Break fuse, Rupture oxide,
- or trap charges in floating gates