Technology
Revolutionary I-fuse® Mechanism
Power devices should not operate in thermal runaway.
Should program a fuse like I-fuse®
I-fuse®
non-Explosive fuse
Guaranteed reliable by physics
efuse
Explosive fuse
Create debris grow back
I-fuse® Core Competence
I-fuse®, the only OTP programming mechanism can be modeled by physics:
heat generation/dissipation and electro-migration
01
Foundry Independent
No extra mask/step;
no hidden layers
Robust OTP Tech
PGM poly/metal- gate /metal fuse,
not MOS
Small Size
No charge pumps;
1/10 eFuse size
02
Low PGM Voltage
Core & I/O (1.1/1.8V)
programmable
Program Mechanism
True electro-migration;
based on physics
Short PGM Time
A shot PGM only;
heat-assisted EM
03
Low Read Voltage
No HV device;
0.4V sub-VDD readable
Low Read Current
1uA read current for energy harvest
04
Wide Temperature
-55~150°C & beyond;
for automotive
High Reliability
Natural defect ＜1ppb;
pass 300°C HTS
Full Testability
Non-destructive PGM
LV PGM & read test
High Data Security
PGM state undetectable;
key unhackable
I-fuse® Core Competence
I-fuse®, the only OTP programming mechanism can be modeled by physics:
heat generation/dissipation and electro-migration
01
Foundry Independent
No extra mask/step;
no hidden layers
Robust OTP Tech
PGM poly/metal- gate /metal fuse,
not MOS
Small Size
No charge pumps;
1/10 eFuse size
02
Low PGM Voltage
Core & I/O (1.1/1.8V)
programmable
Program Mechanism
True electro-migration;
based on physics
Short PGM Time
A shot PGM only;
heat-assisted EM
03
Low Read Voltage
No HV device;
0.4V sub-VDD readable
Low Read Current
1uA read current for energy harvest
04
Wide Temperature
-55~150°C & beyond;
for automotive
High Reliability
Natural defect ＜1ppb;
pass 300°C HTS
Full Testability
Non-destructive PGM
LV PGM & read test
High Data Security
PGM state undetectable;
key unhackable
I-fuse® Full Testablility
OTP inherently not testable
- Fully tested before shipping; but can’t be used any more
- Blank OTP reads all 0s; can’t detect any stuck-at faults
I-fuse® can be fully testable
- Guarantee PGM for all cells: if initial fuse <400Ω to create heat for PGM
- Guarantee 100% programmable: if PGM conditions within specs
- Fully testable*: every functional block, including program circuits
I-fuse® special circuit design (CLVWR)
- Soft PGM before real PGM
- Check every bit function well or not
- Tested in the wafer level before pre-bump
- Needs no 48hr/250°C pre-bake, UV erase, and re-test
Concurrent Low-Voltage Write/Read
- Create “non-destructive PGM” state to generate fake reading 1, not 0
- Low Voltage PGM during read can make unPGM’d fuses read as 1
- Generate 0/1 in SRAM-like of test patterns to fully test OTP macro
I-fuse® Full Testablility
OTP inherently not testable
- Fully tested before shipping; but can’t be used any more
- Blank OTP reads all 0s; can’t detect any stuck-at faults
I-fuse® can be fully testable
- Guarantee PGM for all cells: if initial fuse <400Ω to create heat for PGM
- Guarantee 100% programmable: if PGM conditions within specs
- Fully testable*: every functional block, including program circuits
I-fuse® special circuit design (CLVWR)
- Soft PGM before real PGM
- Check every bit function well or not
- Tested in the wafer level before pre-bump
- Needs no 48hr/250°C pre-bake, UV erase, and re-test
Concurrent Low-Voltage Write/Read
- Create “non-destructive PGM” state to generate fake reading 1, not 0
- Low Voltage PGM during read can make unPGM’d fuses read as 1
- Generate 0/1 in SRAM-like of test patterns to fully test OTP macro
Revolutionary I-fuse® vs Conventional OTP
I-fuse®
eFuse
Oxide rupture
Floating-gate
Revolutionary I-fuse®: Non-breaking fuse
- Very Compact size, no charge pump, high reliability
- PGM’d based on physics laws, like any logic devices
- PGM’d at core/IO voltage, testable as any logic devices
Conventional OTP
- Inherent NVM Problems
- Treat and PGM’d as NVM
- Large size, HV PGM, w/ charge pumps
- Hard to use, low reliability
- Break fuse, Rupture oxide,
- Trap charges in floating gates
Comparison between Revolutionary I-fuse® and Conventional OTP
I-fuse®
Revolutionary I-fuse®: Non-breaking fuse
- Very Compact size, no charge pump, high reliability
- PGM’d based on physics laws, like any logic devices
- PGM’d at core/IO voltage, testable as any logic devices
eFuse
Oxide rupture
Floating-gate
Conventional OTP
- Inherent NVM Problems
- Treat and PGM’d as NVM
- Large size, HV PGM, w/ charge pumps
- Hard to use, low reliability
- Break fuse, Rupture oxide,
- or trap charges in floating gates