Attopsemi Published a Paper in ICMTS 2016, Yokohama, Japan
Hsinchu, Taiwan – May 2, 2016 Attopsemi published a paper “Ultra-small and Ultra-reliable Innovative Fuse Scalable from 0.35um to 28nm” in 2016 International Conference on Microelectronic Test Structures (ICMTS). ICMTS was held in March 28 to 31, 2016 in Yokohama Japan and is the only conference dedicated to semiconductor test structures. In the well-received paper, […]
