/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00martin_hsieh/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngmartin_hsieh2022-05-10 13:55:502023-05-18 11:32:13Latest Attopsemi I-fuse OTP Memories Based on Ground-Breaking New Architecture Now Available on X-FAB’s 180 nm Technology
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00supervisor01/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngsupervisor012021-09-09 14:02:092023-06-19 10:08:56Attopsemi’s I-fuse OTP IP Embedded into NJR’s Products
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00supervisor01/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngsupervisor012021-07-21 14:01:402023-05-18 11:31:59Attopsemi’s I-fuse OTP IP Now Qualified on a Japanese Wafer Fab’s 130 nm BCD and Embedded into ABLIC’s IC Product
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00supervisor01/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngsupervisor012021-04-12 14:01:012023-05-18 11:31:50Attopsemi’s I-fuse OTP IP Qualified and Available on GLOBALFOUNDRIES 22nm FDX-SOI Platform
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00supervisor01/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngsupervisor012021-01-20 13:59:172023-05-18 11:31:40Attopsemi Released White Paper “I-fuse – Most Reliable and Fully Testable OTP”
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00supervisor01/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngsupervisor012020-12-09 13:59:592023-05-18 11:31:29Attopsemi Achieves ISO 9001 Certification for IP Quality Management System
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00supervisor01/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngsupervisor012020-10-08 14:00:312023-05-18 11:31:24Attopsemi’s I-fuse Memory Solution Now Qualified and Available on X-FAB’s 130 nm RF-SOI Technology
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00martin_hsieh/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngmartin_hsieh2019-11-20 14:15:212023-05-18 11:31:00Attopsemi Technology Attended 4th Japan SOI Symposium and Presented a Talk “I-fuse: A Disruptive OTP Technology”
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00martin_hsieh/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngmartin_hsieh2019-10-29 14:09:522023-05-18 11:30:49Attopsemi’s I-fuse OTP IP Embedded into Melexis’ Sensor ICs In Mass Production
/wp-content/uploads/2022/07/Attopsemi-logo_500x200.png00martin_hsieh/wp-content/uploads/2022/07/Attopsemi-logo_500x200.pngmartin_hsieh2019-10-23 14:18:442023-05-18 11:30:34Attopsemi Published Two Papers About Innovative I-fuse™ 0.4V/1uA read and 250°C Bake Reliability Data on 22 nm FD-SOI at IEEE S3S Conference, 2019.
